RIC7113 Total Ionizing Dose Test Report May 2000
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Addendum to RIC7113 Total Ionizing Dose Test Report dated May 2000 December 28, 2001 Wafer traceability is not clear. The following table indicates the connection between the serial numbers and the wafers tested. Wafer Number 2 6 8 10 14 17 20 23 Serial Numbers 1 thru 8 9 thru 18 19 thru 27 28 thru 37 38 thru 47 48 thru 56 57 thru 63 64 thru 73
The last table identifies where each serial number was used: Wafer Dynamic Test Static Test 500krad Number 2 6 8 10 14 17 20 23 8 15 20, 25 30, 33 40, 41 53 63 65, 66 3, 4, 5, 6 12, 16, 17, 18 21, 22, 26, 27 34, 35, 36, 37 44, 45, 46, 47 50, 51, 52, 54 58, 59, 60, 61 68, 69, 70, 73 2 11 None 31 39, 43 48, 56 None 71
Serial Numbers Not Used 1, 7 9, 10, 13, 14 19, 23, 24 28, 29, 32 38, 42 49, 55 57, 62 64, 67, 72
The data above may be used to navigate thru the test report, which did not make consistent use of the serial numbers. The serial numbers are shown at the top row of each column in the test data (Appendix B and C). In some cases the serial number is shown alone and in other cases the wafer number is indicated as a dash number.
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